Program Committee

Albasha Lutfi, American University of Sharjah, AE
Aziza Hassen, Aix-Marseille Université, FR
Ben Dhaou Imed, University of Turku, FI
Bertozzi Davide, University of Manchester, UK
Bishnoi Rajendra, Delft University of Technology, NL
Coyette Anthony, Onsemi / Test & Data Analytics, BE
Ferrandi Fabrizio, Politecnico di Milano, IT
Fieback Moritz, Delft University of Technology, NL
Fiser Petr, Czech Technical University in Prague, CZ
Gebregiorgis Anteneh, Delft University of Technology, NL
Grosso Michelangelo, STMicroelectronics, IT
Grujic Dusan, University of Belgrade, RS
Hadj Said Mohamed, Centre de Recherche en Microélectronique et Nanotechnologie, DZ
Hamdioui Said, Delft University of Technology, NL
Houzet Gregory, Université Savoie Mont Blanc / Grenoble-INP, FR
Kakarountas Athanassios, University of Thessaly, GR
Kanduri Anil, University of Turku, FI
Kilian Tobias, Technical University of Munich, DE
Krstic Milos, University of Potsdam / IHP (Frankfurt Oder), DE
Majzoub Sohaib, University of Sharjah, AE
Masmoudi Mohamed, University of Sfax, TN
Milidonis Athanassios, University of West Attica, GR
Peng Zebo, Linköping University, SE
Periklis Hatzimisios, International Hellenic University, GR
Psychalinos Costas , University of Patras, GR
Ruospo Annachiara, Politecnico di Torino, IT
Sirakoulis Georgios, Democritus University of Thrace, GR
Spyrou Theofilos, Delft University of Technology, NL
Stamenkovic Zoran, University of Potsdam / IHP, DE
Taouil Mottaqiallah, Delft University of Technology, NL
Tlelo-Cuautle Esteban, INAOE, MX
Tsiatouhas Yiorgos, University of Ioannina, GR
Virazel Arnaud, Université de Montpellier, FR
Voyiatzis Ioannis, University of West Attica, GR
Wen Xiaoqing, Kyushu Institute of Technology, JP
Yapici Murat Kaya, Sabanci University / University of Washington, TR